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43
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ASAP
2005
IEEE
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ASAP 2005
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CONAN - A Design Exploration Framework for Reliable Nano-Electronics
14 years 4 months ago
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ce.et.tudelft.nl
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...
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