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DAC
2005
ACM
15 years 13 days ago
OPERA: optimization with ellipsoidal uncertainty for robust analog IC design
As the d esig n-m anu factu ring interface becom es increasing ly com plicated with IC technolog y scaling , the correspond ing process variability poses g reat challeng es for na...
Yang Xu, Kan-Lin Hsiung, Xin Li, Ivan Nausieda, St...