ICCV
2009
IEEE
13 years 11 months ago
2009
IEEE
In this work, we present a technique for robust estimation, which by explicitly incorporating the inherent uncertainty of the estimation procedure, results in a more efficient rob...
ICCAD
2006
IEEE
14 years 10 months ago
2006
IEEE
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...