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    VTS
    1999
    IEEE
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    Partial Scan Using Multi-Hop State Reachability Analysis
    14 years 4 months ago
    Partial Scan Using Multi-Hop State Reachability Analysis
    Download  computing.ece.vt.edu
    Sequential test generators fail to yield tests for some stuck-at-faults because they are unable to reach certain states necessary for exciting propagating these target faults. Add...
    Sameer Sharma, Michael S. Hsiao
    claim paper
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