ICES
2000
Springer
14 years 5 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
IJCNN
2000
IEEE
14 years 6 months ago
2000
IEEE
This paper shows an application in the field of Electronic CAD of the Selfish Gene algorithm, an evolutionary algorithm based on a recent interpretation of the Darwinian theory. Te...