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TII
2008
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TII 2008
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Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels
14 years 11 days ago
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www.ece.neu.edu
This paper presents a novel modeling analysis of jitter as applicable to testing of serial data channels. Jitter is analyzed by considering separate and combined components. The pr...
Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio L...
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