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    VTS
    1997
    IEEE
    90views Hardware» more  VTS 1997»
    SHOrt voltage elevation (SHOVE) test for weak CMOS ICs
    14 years 4 months ago
    SHOrt voltage elevation (SHOVE) test for weak CMOS ICs
    Download  crc.stanford.edu
    A stress procedure for reliability screening, SHOrt Voltage Elevation (SHOVE) test, is analyzed here. During SHOVE, test vectors are run at higher-than-normal supply voltage for a...
    Jonathan T.-Y. Chang, Edward J. McCluskey
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