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48
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ICST
2010
IEEE
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Software Engineering
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ICST 2010
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Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
13 years 10 months ago
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Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...
Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit ...
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