Sciweavers

ICST
2010
IEEE
13 years 10 months ago
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...
Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit ...