Sciweavers

ET
2007
119views more  ET 2007»
13 years 11 months ago
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits
In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...
Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...