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    Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits
    14 years 12 days ago
    Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits
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    In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...
    Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...
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