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FDTC
2011
Springer
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13 years 5 days ago
An In-depth and Black-box Characterization of the Effects of Clock Glitches on 8-bit MCUs
Abstract—The literature about fault analysis typically describes fault injection mechanisms, e.g. glitches and lasers, and cryptanalytic techniques to exploit faults based on som...
Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwh...