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28
Voted
INFSOF
2006
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INFSOF 2006
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Improving test quality using robust unique input/output circuit sequences (UIOCs)
13 years 11 months ago
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bura.brunel.ac.uk
In finite state machine (FSM) based testing, the problem of fault masking in the unique input/output (UIO) sequence may degrade the test performance of the UIO based methods. This...
Qiang Guo, Robert M. Hierons, Mark Harman, Karnig ...
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