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28
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ICCAD
2007
IEEE
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ICCAD 2007
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Combining static and dynamic defect-tolerance techniques for nanoscale memory systems
14 years 8 months ago
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www.cs.ucsb.edu
Abstract— Nanoscale technology promises dramatically increased device density, but also decreased reliability. With bit error rates projected to be as high as 10%, designing a us...
Susmit Biswas, Gang Wang, Tzvetan S. Metodi, Ryan ...
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