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41
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ICCAD
2006
IEEE
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ICCAD 2006
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An electrothermally-aware full-chip substrate temperature gradient evaluation methodology for leakage dominant technologies with
14 years 8 months ago
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nrl.ece.ucsb.edu
As CMOS technology scales into the nanometer regime, power dissipation and associated thermal concerns in high-performance ICs due to on-chip hot-spots and thermal gradients are b...
Sheng-Chih Lin, Kaustav Banerjee
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