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47
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DFT
2008
IEEE
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VLSI
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DFT 2008
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Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis
14 years 2 months ago
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www.ece.unm.edu
This paper addresses a new threat to the security of integrated circuits (ICs). The migration of IC fabrication to untrusted foundries has made ICs vulnerable to malicious alterat...
Xiaoxiao Wang, Hassan Salmani, Mohammad Tehranipoo...
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