Sciweavers

ICCD
2004
IEEE
138views Hardware» more  ICCD 2004»
14 years 9 months ago
A Novel Low-Power Scan Design Technique Using Supply Gating
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Saibal Mukh...