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ASPDAC
2005
ACM
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ASPDAC 2005
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Bridging fault testability of BDD circuits
14 years 26 days ago
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www.informatik.uni-bremen.de
Abstract— In this paper we study the testability of circuits derived from Binary Decision Diagrams (BDDs) under the bridging fault model. It is shown that testability can be form...
Junhao Shi, Görschwin Fey, Rolf Drechsler
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