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ASPDAC
2005
ACM
142views Hardware» more  ASPDAC 2005»
14 years 26 days ago
Bridging fault testability of BDD circuits
Abstract— In this paper we study the testability of circuits derived from Binary Decision Diagrams (BDDs) under the bridging fault model. It is shown that testability can be form...
Junhao Shi, Görschwin Fey, Rolf Drechsler