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TCAD
2010
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TCAD 2010
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Functional Test Generation Using Efficient Property Clustering and Learning Techniques
13 years 6 months ago
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www.cise.ufl.edu
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
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