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CORR
2010
Springer
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13 years 11 months ago
Heuristic approach to optimize the number of test cases for simple circuits
In this paper a new solution is proposed for testing simple stwo stage electronic circuits. It minimizes the number of tests to be performed to determine the genuinity of the circ...
S. M. Thamarai, K. Kuppusamy, T. Meyyappan