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CORR
2010
Springer
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CORR 2010
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Heuristic approach to optimize the number of test cases for simple circuits
13 years 11 months ago
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airccse.org
In this paper a new solution is proposed for testing simple stwo stage electronic circuits. It minimizes the number of tests to be performed to determine the genuinity of the circ...
S. M. Thamarai, K. Kuppusamy, T. Meyyappan
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