In some expensive multiobjective optimization problems, several function evaluations can be carried out at one time. Therefore, it is very desirable to develop methods which can g...
Qingfu Zhang, Wudong Liu, Edward P. K. Tsang, Boto...
The Bayesian committee machine (BCM) is a novel approach to combining estimators which were trained on different data sets. Although the BCM can be applied to the combination of a...
In this paper we introduce the Generalized Bayesian Committee Machine (GBCM) for applications with large data sets. In particular, the GBCM can be used in the context of kernel ba...
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
This paper presents an innovative method for inserting test points in the circuit-under-test to obtain complete fault coverage for a specified set of test patterns. Rather than us...
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points and on IDD switching transients on the sup...
James F. Plusquellic, Donald M. Chiarulli, Steven ...
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
Amy Germida, Zheng Yan, James F. Plusquellic, Fide...