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TEC
2010
129views more  TEC 2010»
13 years 6 months ago
Expensive Multiobjective Optimization by MOEA/D With Gaussian Process Model
In some expensive multiobjective optimization problems, several function evaluations can be carried out at one time. Therefore, it is very desirable to develop methods which can g...
Qingfu Zhang, Wudong Liu, Edward P. K. Tsang, Boto...
NECO
2000
86views more  NECO 2000»
13 years 11 months ago
A Bayesian Committee Machine
The Bayesian committee machine (BCM) is a novel approach to combining estimators which were trained on different data sets. Although the BCM can be applied to the combination of a...
Volker Tresp
KDD
2000
ACM
153views Data Mining» more  KDD 2000»
14 years 2 months ago
The generalized Bayesian committee machine
In this paper we introduce the Generalized Bayesian Committee Machine (GBCM) for applications with large data sets. In particular, the GBCM can be used in the context of kernel ba...
Volker Tresp
ITC
1994
IEEE
151views Hardware» more  ITC 1994»
14 years 3 months ago
Automated Logic Synthesis of Random-Pattern-Testable Circuits
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
Nur A. Touba, Edward J. McCluskey
VTS
1996
IEEE
76views Hardware» more  VTS 1996»
14 years 3 months ago
Test point insertion based on path tracing
This paper presents an innovative method for inserting test points in the circuit-under-test to obtain complete fault coverage for a specified set of test patterns. Rather than us...
Nur A. Touba, Edward J. McCluskey
ITC
1997
IEEE
94views Hardware» more  ITC 1997»
14 years 3 months ago
Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points and on IDD switching transients on the sup...
James F. Plusquellic, Donald M. Chiarulli, Steven ...
ITC
1999
IEEE
89views Hardware» more  ITC 1999»
14 years 3 months ago
Defect detection using power supply transient signal analysis
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
Amy Germida, Zheng Yan, James F. Plusquellic, Fide...