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TAICPART
2010
IEEE
158views Education» more  TAICPART 2010»
13 years 9 months ago
Bad Pairs in Software Testing
Abstract. With pairwise testing, the test model is a list of N parameters. Each test case is an N-tuple; the test space is the cross product of the N parameters. A pairwise test is...
Daniel Hoffman, Chien Chang, Gary Bazdell, Brett S...
ICCAD
2006
IEEE
130views Hardware» more  ICCAD 2006»
14 years 8 months ago
On bounding the delay of a critical path
Process variations cause different behavior of timingdependent effects across different chips. In this work, we analyze one example of timing-dependent effects, crosscoupling ...
Leonard Lee, Li-C. Wang