TAICPART
2010
IEEE
13 years 9 months ago
2010
IEEE
Abstract. With pairwise testing, the test model is a list of N parameters. Each test case is an N-tuple; the test space is the cross product of the N parameters. A pairwise test is...
ICCAD
2006
IEEE
14 years 7 months ago
2006
IEEE
Process variations cause different behavior of timingdependent effects across different chips. In this work, we analyze one example of timing-dependent effects, crosscoupling ...