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38
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VTS
1996
IEEE
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VTS 1996
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Synthesis-for-scan and scan chain ordering
14 years 3 months ago
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www-crc.stanford.edu
Designing a testable circuit is often a two step process. First, the circuit is designed to conform to the functional specifications. Then, the testability aspects are added. By t...
Robert B. Norwood, Edward J. McCluskey
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