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VTS
2000
IEEE
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VTS 2000
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On Testing the Path Delay Faults of a Microprocessor Using its Instruction Set
14 years 27 days ago
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cadlab.ece.ucsb.edu
1 This paper addresses the problem of testing path delay faults in a microprocessor using instructions. It is observed that a structurally testable path (i.e., a path testable thro...
Wei-Cheng Lai, Angela Krstic, Kwang-Ting Cheng
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