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ASPDAC
2006
ACM
115views Hardware» more  ASPDAC 2006»
14 years 5 months ago
Area optimization for leakage reduction and thermal stability in nanometer scale technologies
- Traditionally, minimum possible area of a VLSI layout is considered the best for delay and power minimization due to decreased interconnect capacitance. This paper shows however ...
Ja Chun Ku, Yehea I. Ismail
ICCAD
2006
IEEE
101views Hardware» more  ICCAD 2006»
14 years 8 months ago
Leakage power dependent temperature estimation to predict thermal runaway in FinFET circuits
In this work we propose a methodology to self-consistently solve leakage power with temperature to predict thermal runaway. We target 28nm FinFET based circuits as they are more p...
Jung Hwan Choi, Aditya Bansal, Mesut Meterelliyoz,...