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ICMENS
2005
IEEE
97views Hardware» more  ICMENS 2005»
14 years 5 months ago
A Parametric Study of Thermal Effects on the Reliability of RF MEMS Switches
The influence of thermal effects on the reliability of RF MEMS switches is investigated in this paper. Low power consumption and capacity to handle high power at very high frequen...
Jonathan Lueke, Noor Al Quddus, Walied A. Moussa, ...