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ENTCS
2007
115views more  ENTCS 2007»
13 years 11 months ago
A Global Algorithm for Model-Based Test Suite Generation
Abstract. Model-based testing has been proposed as a technique to automatically verify that a system conforms to its specification. A popular approach is to use a model-checker to...
Anders Hessel, Paul Pettersson
ISVLSI
2007
IEEE
181views VLSI» more  ISVLSI 2007»
14 years 5 months ago
Code-coverage Based Test Vector Generation for SystemC Designs
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
Alair Dias Jr., Diógenes Cecilio da Silva J...