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TR
2008
45views more  TR 2008»
14 years 10 days ago
On-Line Reliability Prediction via Dynamic Failure Rate Model
Rosario Toscano, Patrick Lyonnet
TR
2008
88views more  TR 2008»
14 years 10 days ago
Reliability Sampling Plans Under Progressive Type-I Interval Censoring Using Cost Functions
Abstract--This paper gives a reliability sampling plan for progressively type I interval censored life tests when the lifetime follows the exponential distribution. We use the maxi...
Syuan-Rong Huang, Shuo-Jye Wu
TR
2008
117views more  TR 2008»
14 years 10 days ago
Redundancy Allocation for Series-Parallel Systems Using Integer Linear Programming
We consider the problem of maximizing the reliability of a series-parallel system given cost and weight constraints on the system. The number of components in each subsystem and th...
Alain Billionnet
TR
2008
78views more  TR 2008»
14 years 10 days ago
MOMS-GA: A Multi-Objective Multi-State Genetic Algorithm for System Reliability Optimization Design Problems
A custom genetic algorithm was developed and implemented to solve multiple objective multi-state reliability optimization design problems. Many real-world engineering design proble...
Heidi A. Taboada, Jose F. Espiritu, David W. Coit
TR
2008
107views more  TR 2008»
14 years 10 days ago
A New Shared Segment Protection Method for Survivable Networks with Guaranteed Recovery Time
Shared Segment Protection (SSP), compared with Shared Path Protection (SPP), and Shared Link Protection (SLP), provides an optimal protection configuration due to the ability of ma...
János Tapolcai, Pin-Han Ho, Dominique Verch...
TR
2008
164views more  TR 2008»
14 years 10 days ago
Inference Based on Type-II Hybrid Censored Data From a Weibull Distribution
A hybrid censoring scheme is a mixture of Type-I and Type-II censoring schemes. This article presents the statistical inferences on Weibull parameters when the data are Type-II hyb...
Aveek Banerjee, Debasis Kundu
TR
2008
67views more  TR 2008»
14 years 10 days ago
Degradation Analysis of Nano-Contamination in Plasma Display Panels
Abstract--As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can...
Suk Joo Bae, Seong-Joon Kim, Man Soo Kim, Bae Jin ...
TR
2008
98views more  TR 2008»
14 years 10 days ago
Application of Vulnerability Discovery Models to Major Operating Systems
A number of security vulnerabilities have been reported in the Windows, and Linux operating systems. Both the developers, and users of operating systems have to utilize significant...
Omar H. Alhazmi, Yashwant K. Malaiya
TR
2008
81views more  TR 2008»
14 years 10 days ago
The Relationship Between Confidence Intervals for Failure Probabilities and Life Time Quantiles
The failure probability of a product F(t) and the life time quantile tp are commonly used metrics in reliability applications. Confidence intervals are used to quantify the statis...
Yili Hong, William Q. Meeker, Luis A. Escobar