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118
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IOLTS
2009
IEEE
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IOLTS 2009
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On-line characterization and reconfiguration for single event upset variations
15 years 9 months ago
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www.eecs.umich.edu
The amount of physical variation among electronic components on a die is increasing rapidly. There is a need for a better understanding of variations in transient fault susceptibil...
Kenneth M. Zick, John P. Hayes
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