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ITC
1989
IEEE
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14 years 4 months ago
CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
Jerry M. Soden, R. Keith Treece, Michael R. Taylor...