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ITC
1999
IEEE
89views Hardware» more  ITC 1999»
14 years 3 months ago
Defect detection using power supply transient signal analysis
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
Amy Germida, Zheng Yan, James F. Plusquellic, Fide...