ITC
1997
IEEE
14 years 5 months ago
1997
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points and on IDD switching transients on the sup...
DFT
1998
IEEE
14 years 5 months ago
1998
IEEE
We present the results of hardware experiments designed to determine the relative contribution of CMOS coupling mechanisms to off-path signal variations caused by common types of ...
ITC
1999
IEEE
14 years 5 months ago
1999
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
VTS
2000
IEEE
14 years 5 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...