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ICCAD
2006
IEEE
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ICCAD 2006
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Simultaneous power and thermal integrity driven via stapling in 3D ICs
14 years 11 months ago
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eda.ee.ucla.edu
The existing work on via-stapling in 3D integrated circuits optimizes power and thermal integrity separately and uses steadystate thermal analysis. This paper presents the first ...
Hao Yu, Joanna Ho, Lei He
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