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JCP
2008
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JCP 2008
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Leakage Controlled Read Stable Static Random Access Memories
13 years 10 months ago
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Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
Sayeed A. Badrudduza, Ziyan Wang, Giby Samson, Law...
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