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ICCAD
2006
IEEE
134views Hardware» more  ICCAD 2006»
14 years 9 months ago
A delay fault model for at-speed fault simulation and test generation
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
Irith Pomeranz, Sudhakar M. Reddy