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    Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
    13 years 11 months ago
    Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
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    In this paper a novel architecture for scan-based mixed mode BIST is presented. To reduce the storage requirements for the deterministic patterns it relies on a two-dimensional co...
    Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wun...
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