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HICSS
2010
IEEE
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Biometrics
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HICSS 2010
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Combining Phasor Measurements to Monitor Cutset Angles
15 years 10 months ago
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www.hicss.hawaii.edu
Power systems under stress can show large voltage angle differences between areas that can be monitored by wide area phasor measurements. One way to make this idea more specific ...
Ian Dobson, Manu Parashar, Chelsea Carter
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