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WCRE
2002
IEEE
14 years 10 days ago
Relating Expectations to Automatically Recovered Design Patterns
At MITRE we are developing tools to aid analysts in assessing the operational usability and quality of object-oriented code. Our tools statically examine source code, automaticall...
Angel Asencio, Sam Cardman, David Harris, Ellen La...
WCRE
2002
IEEE
14 years 10 days ago
Exposing Data-Level Parallelism in Sequential Image Processing Algorithms
As new computer architectures are developed to exploit large-scale data-level parallelism, techniques are needed to retarget legacy sequential code to these platforms. Sequential ...
Lewis B. Baumstark Jr., Linda M. Wills