Sciweavers

ATS   1996 Asian Test Symposium
Wall of Fame | Most Viewed ATS-1996 Paper
ATS
1996
IEEE
117views Hardware» more  ATS 1996»
14 years 4 months ago
Hierarchical Test Generation with Built-In Fault Diagnosis
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...
Dirk Stroobandt, Jan Van Campenhout
Disclaimer and Copyright Notice
Sciweavers respects the rights of all copyright holders and in this regard, authors are only allowed to share a link to their preprint paper on their own website. Every contribution is associated with a desciptive image. It is the sole responsibility of the authors to ensure that their posted image is not copyright infringing. This service is compliant with IEEE copyright.
IdReadViewsTitleStatus
1Download preprint from source117
2Download preprint from source93