DFT 2009 IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
 |  |
Wall of Fame | Most Viewed DFT-2009 Paper
DFT
2009
IEEE
14 years 2 months ago
2009
IEEE
Optimizing the BIST configuration based on the characteristics of the design under test is a complicated and challenging work for test engineers. Since this problem has multiple o...
Disclaimer and Copyright Notice
Sciweavers respects the rights of all copyright holders and in this regard, authors are only allowed to share a link to their preprint paper on their own website.
Every contribution is associated with a desciptive image. It is the sole responsibility of the authors to ensure that their posted image is not copyright infringing. This service is compliant with IEEE copyright.
| Id | Read | Views | Title | Status |
|---|---|---|---|---|
| 1 |  | 210 | ||
| 2 | | 189 | ||
| 3 | | 178 | ||
| 4 | | 175 | ||
| 5 | | 155 | ||
| 6 | | 154 | ||
| 7 | | 139 | ||
| 8 | | 127 | ||
| 9 | | 106 |