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EMSOFT   2005 International Conference On Embedded Software
Wall of Fame | Most Viewed EMSOFT-2005 Paper
EMSOFT
2005
Springer
14 years 6 months ago
Compiler-guided register reliability improvement against soft errors
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
Jun Yan, Wei Zhang
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