IOLTS 2007 - PDF Preprint Papers

IOLTS 2007 IEEE International On-Line Testing Symposium

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IOLTS
2007
IEEE

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On Derating Soft Error Probability Based on Strength Filtering

14 years 6 months ago

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— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A signiﬁcant frac...

Alodeep Sanyal, Sandip Kundu

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