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VTS 2006 IEEE VLSI Test Symposium

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VTS
2006
IEEE

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PEAKASO: Peak-Temperature Aware Scan-Vector Optimization

14 years 6 months ago

Download www.cerc.utexas.edu

— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...

Minsik Cho, David Z. Pan

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Id	Views	Title	Status

1	133	PEAKASO: Peak-Temperature Aware Scan-Vector Optimization	claim
2	122	Mixed PLB and Interconnect BIST for FPGAs Without Fault-Free Assumptions	claim
3	122	Early, Accurate and Fast Yield Estimation through Monte Carlo-Alternative Probabilistic Behavioral Analog System Simulations	claim
4	118	X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data	claim
5	116	Combining Linear and Non-Linear Test Vector Compression Using Correlation-Based Rectangular Encoding	claim
6	108	Bridging the Accuracy of Functional and Machine-Learning-Based Mixed-Signal Testing	claim
7	102	Energy Efficient Software-Based Self-Test for Wireless Sensor Network Nodes	claim
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9	98	Iterative OPDD Based Signal Probability Calculation	claim
10	95	Integrated CMOS Power Sensors for RF BIST Applications	claim
11	93	Upper Bounding Fault Coverage by Structural Analysis and Signal Monitoring	claim

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