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23

ITCC
2005
IEEE

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Effective Steganalysis Based on Statistical Moments of Wavelet Characteristic Function

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Effective Steganalysis Based on Statistical Moments of Wavelet Characteristic Function

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Yun Q. Shi, Guorong Xuan, Chengyun Yang, Jianjiong

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Added	25 Jun 2010
Updated	25 Jun 2010
Type	Conference
Year	2005
Where	ITCC
Authors	Yun Q. Shi, Guorong Xuan, Chengyun Yang, Jianjiong Gao, Zhenping Zhang, Peiqi Chai, Dekun Zou, Chunhua Chen, Wen Chen

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