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25

GLVLSI
2003
IEEE

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MuTaTe: an efficient design for testability technique for multiplexor based circuits

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MuTaTe: an efficient design for testability technique for multiplexor based circuits

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Rolf Drechsler, Junhao Shi, Görschwin Fey

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GLVLSI 2003 | VLSI |

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Added	04 Jul 2010
Updated	04 Jul 2010
Type	Conference
Year	2003
Where	GLVLSI
Authors	Rolf Drechsler, Junhao Shi, Görschwin Fey

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