Designing FPGA based Self-Testing Checkers for m-out-of-n Codes

The paper describes a specific method for designing selfchecking checkers for m-out-of-n codes. The method is oriented to the Field Programmable Gate Arrays technology and is based on decomposing the sum-ofminterms corresponding to an m-out-of-n code. The selftesting property of the proposed checker is proven for a set of multiple stuck-at faults at input and output poles of a Logic Cell. An estimated complexity of obtained m-outof-n checker demonstrates high efficiency of the proposed method.

• Type: Conference
• Year: 2003
• Where: IOLTS
• Authors: A. Matrosova, Vladimir Ostrovsky, Ilya Levin, K. Nikitin
• Keywords: IOLTS 2003, M-out-of-n Code, Programmable Gate Arrays, Software Engineering, Specific Method