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17

CAIP
2003
Springer

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A New Sharpness Measure Based on Gaussian Lines and Edges

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A New Sharpness Measure Based on Gaussian Lines and Edges

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Judith Dijk, Michael van Ginkel, Rutger J. van Ass

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Added	06 Jul 2010
Updated	06 Jul 2010
Type	Conference
Year	2003
Where	CAIP
Authors	Judith Dijk, Michael van Ginkel, Rutger J. van Asselt, Lucas J. van Vliet, Piet W. Verbeek

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