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ATS
2009
IEEE

New Class of Tests for Open Faults with Considering Adjacent Lines

14 years 4 months ago
New Class of Tests for Open Faults with Considering Adjacent Lines
Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamats
Added 21 Jul 2010
Updated 21 Jul 2010
Type Conference
Year 2009
Where ATS
Authors Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Toshiyuki Tsutsumi, Hiroyuki Yotsuyanagi, Masaki Hashizume
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