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HASE
1998
IEEE

In-Parameter-Order: A Test Generation Strategy for Pairwise Testing

14 years 3 months ago
In-Parameter-Order: A Test Generation Strategy for Pairwise Testing
Yu Lei, Kuo-Chung Tai
Added 04 Aug 2010
Updated 04 Aug 2010
Type Conference
Year 1998
Where HASE
Authors Yu Lei, Kuo-Chung Tai
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