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    DFT
    2007
    IEEE
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    Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines

    14 years 3 months ago
    Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines
    Download  pub2.db.tokushima-u.ac.jp
    Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa,
    claim paper
    Added 14 Aug 2010
    Updated 14 Aug 2010
    Type Conference
    Year 2007
    Where DFT
    Authors Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume
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