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AIS
2004
Springer

Timed I/O Test Sequences for Discrete Event Model Verification

14 years 3 months ago
Timed I/O Test Sequences for Discrete Event Model Verification
Abstract. Model verification examines the correctness of a model implementation with respect to a model specification. While being described from model specification, implementation prepares to execute or evaluate a simulation model by a computer program. Viewing model verification as a program test this paper proposes a method for generation of test sequences that completely covers all possible behavior in specification at an I/O level. Timed State Reachability Graph (TSRG) is proposed as a means of model specification. Graph theoretical analysis of TSRG has generated a test set of timed I/O event sequences, which guarantees 100% test coverage of an implementation under test.
Ki Jung Hong, Tag Gon Kim
Added 20 Aug 2010
Updated 20 Aug 2010
Type Conference
Year 2004
Where AIS
Authors Ki Jung Hong, Tag Gon Kim
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