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    DDECS
    2006
    IEEE
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    Embedded Self Repair by Transistor and Gate Level Reconfiguration

    14 years 3 months ago
    Embedded Self Repair by Transistor and Gate Level Reconfiguration
    Download  ewdtest.com
    René Kothe, Heinrich Theodor Vierhaus, Tors
    claim paper
    Added 22 Aug 2010
    Updated 22 Aug 2010
    Type Conference
    Year 2006
    Where DDECS
    Authors René Kothe, Heinrich Theodor Vierhaus, Torsten Coym, Wolfgang Vermeiren, Bernd Straube
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